2N7002DW L6327

2N7002DW L6327

  • Description:MOSFET 2N-CH 60V 0.3A SOT363
  • Series:OptiMOS™

SKU:cb5cf9b8cc28 Category: Brand:

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Product Detailed Parameters

  • Description:MOSFET 2N-CH 60V 0.3A SOT363
  • Series:OptiMOS™
  • Mfr:Infineon Technologies
  • Package:Tape & Reel (TR)
  • Technology:MOSFET (Metal Oxide)
  • Configuration:2 N-Channel (Dual)
  • FET Feature:Logic Level Gate
  • Drain to Source Voltage (Vdss):60V
  • Current - Continuous Drain (Id) @ 25°C:300mA
  • Rds On (Max) @ Id, Vgs:3Ohm @ 500mA, 10V
  • Vgs(th) (Max) @ Id:2.5V @ 250µA
  • Gate Charge (Qg) (Max) @ Vgs:0.6nC @ 10V
  • Input Capacitance (Ciss) (Max) @ Vds:20pF @ 25V
  • Power - Max:500mW
  • Operating Temperature:-55°C ~ 150°C (TJ)
  • Mounting Type:Surface Mount
  • Package / Case:6-VSSOP, SC-88, SOT-363
  • Supplier Device Package:PG-SOT363-PO
  • Grade:-
  • Qualification:-

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2N7002DW L6327

Buying Guide
Summary

Infineon Technologies 2N7002DW-L6327 is sourced in FET, MOSFET Arrays category when teams want clear constraints and a repeatable validation path. Key specs include Description (MOSFET 2N-CH 60V 0.3A SOT363), Series (OptiMOS™), Packaging (Tape & Reel (TR)), Temperature (-55°C ~ 150°C (TJ)), and Package/case (6-VSSOP, SC-88, SOT-363).

Selection Notes
  • For 2N7002DW-L6327, verify the operating temperature range (-55°C ~ 150°C (TJ)) and derate as needed in your application.
  • Validate Current - Continuous Drain (Id) @ 25°C (300mA) under the expected test conditions in your application.
  • Double-check the mounting type (Surface Mount) for your intended installation method.
Alternates & Substitutions
  • For FET, MOSFET Arrays, compare the datasheet test conditions behind key specs and re-check the margins that were tightest during bring-up.
  • Treat package/case 6-VSSOP, SC-88, SOT-363, supplier package PG-SOT363-PO, mounting Surface Mount as the first filter, then move on to electrical and performance checks.
  • Check that temperature -55°C ~ 150°C (TJ) matches your system, then validate at corners instead of relying on typical values.
  • If you are qualifying a second source, align documentation/traceability requirements early to avoid surprises in procurement.
FAQ

What FET Feature is listed for 2N7002DW-L6327?
Logic Level Gate

Which Rds On (Max) @ Id, Vgs is specified for 2N7002DW-L6327?
3Ohm @ 500mA, 10V

Can you confirm the Technology for 2N7002DW-L6327?
MOSFET (Metal Oxide)

Which Gate Charge (Qg) (Max) @ Vgs is listed for 2N7002DW-L6327?
0.6nC @ 10V

Application Scenarios

In the FET, MOSFET Arrays category, Infineon Technologies 2N7002DW-L6327 is often evaluated by how well it fits electrical, thermal, and mechanical constraints in the target system. They are typically used when a design must handle inductive loads, fast edges, or high current in compact footprints. A good discrete switch choice improves efficiency and robustness while keeping thermal design and qualification predictable. In robotics, actuator and motor switching stages are validated for stalls and rapid reversals without unsafe operating conditions. Across motor control and robotics, MOSFET stages must survive stalls and reversals, so SOA and transient strategy are validated under real waveforms. Within power adapters, switching stages balance conduction loss and switching loss, where gate drive and thermal design determine repeatability. Engineers typically treat gate drive, layout, and SOA as system-level constraints because they dominate switching behavior and EMI.

Compatibility Advice
  • To avoid late surprises, validate gate/base drive assumptions and switching transitions so losses and EMI stay inside the system budget. This keeps integration from depending on typical-only conditions.
  • To avoid late surprises, confirm package and mounting constraints so parasitics remain consistent across assembly variance. This avoids one-off tuning in production.
Project Fit
  • Less ideal when integrating Infineon Technologies 2N7002DW-L6327 for FET, MOSFET Arrays, layout and parasitics cannot be controlled enough to keep transient stress predictable, because validation would rely on assumptions that cannot be re-tested later.
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