INA333AIDRGT

INA333AIDRGT

$4.81
  • Description:IC INST AMP 1 CIRCUIT 8SON
  • Series:-
  • Mfr:Texas Instruments
  • Package:Tape & Reel (TR),Cut Tape (CT)

SKU:31d131ba4512 Category: Brand:

  
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Product Detailed Parameters

  • Description:IC INST AMP 1 CIRCUIT 8SON
  • Series:-
  • Mfr:Texas Instruments
  • Package:Tape & Reel (TR),Cut Tape (CT)
  • Amplifier Type:Instrumentation
  • Number of Circuits:1
  • Output Type:Rail-to-Rail
  • Slew Rate:0.16V/µs
  • Gain Bandwidth Product:-
  • Current - Input Bias:70 pA
  • Voltage - Input Offset:10 µV
  • Current - Supply:50µA
  • Current - Output / Channel:40 mA
  • Voltage - Supply Span (Min):1.8 V
  • Voltage - Supply Span (Max):5.5 V
  • Operating Temperature:-40°C ~ 125°C
  • Grade:-
  • Qualification:-
  • Mounting Type:Surface Mount
  • Package / Case:8-WFDFN Exposed Pad
  • Supplier Device Package:8-SON (3x3)
  • -3db Bandwidth:150 kHz

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INA333AIDRGT

Buying Guide
Summary

Texas Instruments INA333AIDRGT is used in Instrumentation, Op Amps, Buffer Amps category where bandwidth, stability, and noise behavior need to be validated in the real signal chain. Key specs include Description (IC INST AMP 1 CIRCUIT 8SON), Output type (Rail-to-Rail), Temperature (-40°C ~ 125°C), Package/case (8-WFDFN Exposed Pad), and Mounting (Surface Mount).

Selection Notes
  • For INA333AIDRGT, verify the operating temperature range (-40°C ~ 125°C) and derate as needed in your application.
  • Confirm Voltage - Input Offset (10 µV) and ensure it matches your integration requirements.
  • Double-check the mounting type (Surface Mount) for your intended installation method.
  • Verify the bandwidth (150 kHz) covers your signal chain requirements without excessive attenuation.
Alternates & Substitutions
  • For Instrumentation, Op Amps, Buffer Amps, validate alternates under worst-case corners rather than assuming typical-only conditions represent production builds.
  • For any substitution, verify the datasheet conditions behind headline specs and validate the alternate under your worst-case operating corners.
  • Start by confirming the physical match (package/case 8-WFDFN Exposed Pad, supplier package 8-SON (3x3), mounting Surface Mount) so the swap does not create a footprint risk.
  • When in doubt, treat the swap as an ECO: define acceptance criteria, then validate under worst-case operating corners.
FAQ

How do I validate INA333AIDRGT in my design?
Verify stability under your expected capacitive load, confirm the common-mode voltage range, and check output swing limits.

What is the package/case of INA333AIDRGT?
8-WFDFN Exposed Pad

What is the packaging of INA333AIDRGT?
Tape & Reel (TR), Cut Tape (CT)

Which Amplifier Type is listed for INA333AIDRGT?
Instrumentation

Application Scenarios

In many Instrumentation, Op Amps, Buffer Amps builds, Texas Instruments INA333AIDRGT is reviewed for predictable behavior, supportability, and stable qualification evidence. Engineers generally pay close attention to grounding, references, interface timing, and loading so end-to-end performance is preserved on the PCB. Teams generally verify grounding, reference integrity, interface timing, and loading because small errors compound across the chain. Within laboratory instruments, calibration repeatability depends on grounding, reference integrity, and stable long-term behavior. In industrial weighing and pressure systems, instrumentation amplifiers read bridge sensors over long cables, where CMRR and input protection determine usable accuracy. In medical instruments, low-drift in-amps condition biopotential and low-level sensor signals where noise and offset stability dominate the error budget. Instrumentation amplifiers are chosen around CMRR, input offset/drift, noise, and input protection when long cables and ground shifts are present. When the design is testable, it is also easier to support, troubleshoot, and evolve.

Compatibility Advice
  • In board-level integration, check noise, bias currents, and offset drift against your measurement budget across temperature before committing to volume builds.
Project Fit
  • Good fit when you can verify Texas Instruments INA333AIDRGT for Instrumentation, Op Amps, Buffer Amps integration under realistic load and noise, and you can control references, grounding, and layout so performance is reproducible.
  • Poor fit when production test access is too limited to verify the key performance metrics, because it becomes difficult to prove margin across production variance.
INA333AIDRGTINA333AIDRGT
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